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Aug 06, 2026
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NANO 202 - Characterization and Testing of Nanotechnology Structures and Materials
PROGRAM: Nanotechnology
CREDIT HOURS MIN: 3
LECTURE HOURS MIN: 2
LAB HOURS MIN: 2
DATE OF LAST REVISION: Spring, 2019
COURSE DESCRIPTION: This course examines a variety of techniques and measurements essential for identification and analysis of material properties, and for controlling material fabrication. Characterization includes electrical, optical, physical, and chemical approaches, with a focus on scanning probe and electron microscopy techniques. The characterization experience will include hands-on use of tools such as the Atomic Force Microscope (AFM), Scanning Electron Microscope (SEM) and Contact Angle Goniometer.
MAJOR COURSE LEARNING OBJECTIVES: Upon successful completion of this course the student will be expected to:
- Perform basic characterization techniques.
- Understand common spectroscopic measurements.
- Perform electron microscopy imaging.
- Perform Advanced Scanning Probe Microscopy imaging.
- Perform Surface Analysis.
COURSE CONTENT: Topical areas of study include -
- Process Control: Scanning Probe Microscopy Tools
- Process Control: Contact Mode Atomic Force Microscopy
- Process Control: Intermittent Mode & Non-Contact Mode AFM
- Scanning Tunneling Microscopy
- Scanning Electron Microscopy
- Transmission Electron Microscopy
- Introduction to FESEM
Course Addendum - Syllabus (Click to expand)
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