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Aug 06, 2026
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EECT 152 - Microsystems Characterization
PROGRAM: Electronics and Computer Technology
CREDIT HOURS MIN: 3
LECTURE HOURS MIN: 2
LAB HOURS MIN: 2
TOTAL CONTACT HOURS MIN: 64
DATE OF LAST REVISION: Fall 2025
This course will introduce the principles and techniques used to test and characterize semiconductor and microelectronic devices. Microelectronic devices and sensors will be used to measure and analyze device behavior, demonstrate circuit functionality, and relate experimental data to theoretical models. Topics will include I-V characterization, parameter extraction, digital logic testing, statistical analysis, and data documentation. Emphasis will be placed on developing skills used in semiconductor and electronics testing laboratories, such as practical measurement, troubleshooting, and data interpretation.
MAJOR COURSE LEARNING OBJECTIVES:
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Develop various device models for electrical and mechanical systems.
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Validate a device model with statistical analysis.
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Perform I-V measurements of devices, such as diodes, transistors, and logic devices.
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Derive key device parameters, such as threshold voltage, gain, and leakage current, from measured data.
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Apply digital logic concepts to verify and troubleshoot basic circuit functions.
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Correlate measured results semiconductor devices with simulated and theoretical models.
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Document experimental results and prepare technical data reports.
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Describe how purchase and temperature lead to variability in part performance.
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Demonstrate proper ESD control and measurement device operation.
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Communicate test findings and recommendations in professional written and oral formats.
COURSE CONTENT: Topical areas of study include -
- Device testing and characterization
- Digital logic testing
- Electronics measurements and instrumentation
- Signal integrity basics
- Statistical data analysis
- Yield verification
- Diode and transistor parameter extraction and modeling
- Troubleshooting and diagnostic methods
- Model development, verification, and validation
- Device reliability and temperature-stress testing
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