EECT 153 - Microsystems Testing and Process Control

1. Explain the role of automation and quality assurance in semiconductor device testing.

2. Integrate laboratory instruments into an automated data-acquisition system.

3. Develop virtual instruments in software for instrument control, measurement, and logging.

4. Perform automated I-V sweeps and long-term reliability and stress testing of semiconductor devices.

5. Apply statistical process-control methods to evaluate device performance and yield.

6. Create standard operating procedures (SOP’s) for QA/QC testing.

7. Conduct preliminary failure analysis using data-driven reasoning.

8. Implement calibration and measurement verification techniques to ensure accuracy and repeatability.

9. Present data using graphs, trend charts, and professional reporting standards.

10. Demonstrate teamwork, safety, and professional communication skills in a laboratory environment.

• Semiconductor manufacturing laboratory automation
• Quality assurance and control principles in semiconductor manufacturing
• Virtual instrumentation concepts
• Automated control systems
• Automated measurement and characterization
• Reliability, endurance, and environmental stress testing
• Statistical process control 
• Failure analysis
• Experimental test design and documentation
• Calibration