Apr 26, 2024  
2022-2023 Catalog 
    
2022-2023 Catalog [ARCHIVED CATALOG]

ADMF 211 - Quality Systems in Manufacturing


PREREQUISITES: Demonstrated competency through appropriate assessment or earning a grade of “C” or better in MATH 122 - Applied Technical Mathematics .
PROGRAM: Advanced Automation and Robotics Technology
CREDIT HOURS MIN: 3
LECTURE HOURS MIN: 3
DATE OF LAST REVISION: Spring, 2019

Covers current quality improvement concepts and techniques in industry with emphasis on modern manufacturing requirements. This course introduces the fundamental tools of Statistical Process Control (SPC) as they are used in industry to reduce costs, identify root cause, and increase productivity at a predictable quality level. Applied principles and techniques of total quality systems will be utilized to ensure correct definition, measurement, analysis, and improvement of common manufacturing problems. Areas of study include; basic statistical and probability theory, sampling techniques, process control charts, nature of variation, histograms, attributes and variable charts.

MAJOR COURSE LEARNING OBJECTIVES: Upon successful completion of this course the student will be expected to:

  1. Discuss why identifying and defining a problem is a crucial step in any problem-solving method. [e]
  2. Discuss critical thinking, problem analysis, and decision-making techniques used in industry. [e]
  3. Utilize tools and tables commonly used in continuous improvement and root cause analysis. [i]
  4. Explain the basic concepts and applications of a wide range of statistical quality tools, techniques, decision making, and problem solving tools. [i]
  5. Prepare and present data. [i]
  6. Analyze data using mean, mode, and standard deviation. [i]
  7. Describe the concept of Six Sigma. [i]
  8. Describe and demonstrate the fundamentals of SPC. [i]
  9. Generate and interpret basic variable and attribute control charts. [i]
  10. Create process maps and develop cause and effect strategies. [f,i]
  11. Discuss the Cost of Poor Quality (COPQ) and methods of reduction. [f,i]
  12. Describe the concept of Return on Investment (ROI) and target opportunities. [f,i]
  13. Demonstrate ability to read and interpret technical documents. [b,e]
  14. Demonstrate ability to use various types of software applicable to course. [a]

Note: Letters following objectives correspond to ATMAE Outcomes

COURSE CONTENT: Topical areas of study include -  

  • Data Formats
  • Total Quality Systems
  • Organization of Data
  • Pareto analysis
  • Statistics
  • Variable control charts
  • Measures of Central Tendency
  • Attribute control charts
  • Normal distribution
  • Basic probability
  • Calculation of Process Cost
  • Cost of Poor Quality
  • Process Mapping
  • Six Sigma
  • Cause and Effect Diagrams
  • Failure Mode and Effects Analysis
  • Process capability
  • Return on Investment

 
GRADING POLICY

A 90-100
B 80-89
C 70-79
D 60-69
F 0-59

 
Course Addendum - Syllabus (Click to expand)