2022-2023 Catalog [ARCHIVED CATALOG]
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MEMS 102 - Microsystems Characterization
PROGRAM: Electronics and Computer Technology/Electrical Engineering Technology
CREDIT HOURS MIN: 3
LECTURE HOURS MIN: 2
LAB HOURS MIN: 2
DATE OF LAST REVISION: Fall 2021
MEMS 102 will introduce the subject of characterizations of MEMS devices. This course will use off the shelf electronic devices and sensors. The focus will be on device characterization and the use of lab equipment and LabView. Device modeling will be explored to see how simulation models are developed and used to predict circuit performance. Some statistics will also be introduced to describe how parts vary. This variability will be added to the device models.
MAJOR COURSE LEARNING OBJECTIVES: Upon successful completion of this course the student will be expected to:
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Analyze, construct and troubleshoot various device models for electrical and mechanical systems.
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Understand how to verify and validate a device model.
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Compare different test circuits for device models.
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Describe device models for diodes, transistors, FETs and MOSFETs.
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Develop behavioral models for mechanical devices.
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Build, simulate and troubleshoot device models for semiconductors.
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Demonstrate knowledge of resistance, inductance and capacitance variability.
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Describe how purchase and temperature include variability in part performance.
COURSE CONTENT: Topical areas of study include -
Behavioral Device Models Passive Part Variability
Model Testing Use of Minitab
PSPICE Model Editor Diode Equation
Gaussian Distributions Model Verification and Validation
Device Testing Temperature Coefficients
GRADING POLICY
A……………90-100
B…………….80-89
C…………….70-79
D……………60-69
F…………….0-59
Course Addendum - Syllabus (Click to expand)
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